By P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B R L Siebert
This quantity collects the refereed contributions in accordance with the shows made on the 7th Workshop on complex Mathematical and Computational instruments in Metrology, a discussion board for metrologists, mathematicians and software program engineers that would motivate a better synthesis of abilities, features and assets. the amount comprises articles by way of global popular metrologists and mathematicians concerned about dimension technological know-how and, including the six earlier volumes during this sequence, constitutes an authoritative resource of the mathematical, statistical and software program instruments useful in sleek metrology.
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Additional info for Advanced Mathematical and Computational Tools in Metrology VII: 7
4) To control the mean value of the industrial process, use the TMdchart instead of the usual X-chart. R-chart should be used. 1. As time goes on, it is sensible to use the larger quantity of data available in-control, and re-evaluate the estimates needed. 's. However, in a situation of compromise between efficiency and robustness, we can advise the use of "robust" control charts for monitoring the mean and the standard deviation of an industrial process. Since modelling the available data adequately is a delicate problem in Statistics, and the performance of charts based on the Box-Cox transformed 46 d a t a or based on the original d a t a (together with the knowledge of the specific underlying model, assumed t o be known) do not differ significantly, we suggest as a possible and interesting alternative to d a t a modelling, t h e use of the Box-Cox transformation.
E. Strawderman. Statistical analysis of key comparisons with linear trends. Metrologia, 41:231-237, 2004. Advanced Mathematical and Computational Tools in Metrology VII Edited by P. Ciarlini, E. Filipe, A. B. Forbes, F. Pavese, C. Perruchet & B. Siebert © 2006 World Scientific Publishing Co. (pp. 35-46) BOX-COX T R A N S F O R M A T I O N S A N D R O B U S T CONTROL CHARTS I N SPC FERNANDA OTILIA FIGUEIREDO Faculdade de Economia da Universidade do Porto and CEAUL Rua Dr Roberto Frias, 4200-464 Porto PORTUGAL MARIA IVETTE GOMES CEA UL and DEIO, Universidade de Lisboa Bloco C2, Campo Grande, 1700 Lisboa PORTUGAL In this paper we consider some asymetric models to describe the d a t a process.
On the analysis of measurement comparisons. Metrologia, 41:122-131, 2004. R. Willink. Statistical determination of a comparison reference value using hidden errors. Metrologia, 39:343-354, 2002. W. Woger. Remarks on the key comparison reference value. In NCSL International Workshop and Symposium, Washington, USA, 2005. Emma Woolliams, Maurice Cox, Nigel Fox, and Peter Harris. Final report of the CCPR Kl-a Key Comparison of Spectral Irradiance 250 to 2500 nm. Technical report, National Physical Laboratory, Teddington, UK, 2005.
Advanced Mathematical and Computational Tools in Metrology VII: 7 by P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B R L Siebert